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Browsing by Author "Slesazech, S."

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    Two-dimensional carrier profiling in advanced devices with pico-meter resolution

    Vandervorst, Wilfried  
    ;
    Alvarez, David
    ;
    Eyben, Pierre  
    ;
    Fouchier, Marc
    ;
    Hartwich, J.
    Proceedings paper
    2004, Proceedings Ultimate Integration of Silicon (ULIS) Workshop, 11/03/2004, p.63-67

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