Browsing by Author "Slesazeck, Stefan"
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Publication Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Journal article2001, Microelectronic Engineering, (57-58) 1_4, p.749-754Publication Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Oral presentation2000, Micro- and Nano-engineering Conference; September 2000; Jena, Germany.Publication Mounting of moulded AFM probes by soldering
Proceedings paper2000, Materials and Device Characterization in Micromachining III, 17/09/2000, p.62-73Publication The peel-off probe: a cost-effective probe for electrical atomic force microscopy
Proceedings paper2000, Materials and Device Characterization in Micromachining III, 17/09/2000, p.50-59