Browsing by Author "Smedes, Theo"
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Publication HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform
;Muhonen, Kathleen ;Ashton, Robert ;Smedes, Theo ;Scholz, MirkoVelghe, RudolfProceedings paper2012-09, EOS/ESD Symposium, 9/09/2012Publication HMM single site testing: Can we reproduce component failure level with the HMM document?
;Scholz, Mirko ;Ashton, Robert ;Smedes, Theo ;Derikx, Richard ;Dekker, MarcelBarth, JonProceedings paper2016-09, 38th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD, 11/09/2016, p.3B.3