Browsing by Author "Sohn, Dol"
Now showing 1 - 1 of 1
- Results per page
- Sort Options
Publication Investigation of DC Characteristics Degradation in Silicon Nanosheet FET Due to Interface Traps
;Sohn, Dol ;Yoon, Sung-Su ;Park, Hyo-Jun ;Yun, Eui-Cheol ;Lee, Moon-Kwon ;Bang, Da-EunKim, Min-WooJournal article2026, IEEE ACCESS, 14, p.122524-122535