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Browsing by Author "Sohn, Dol"

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    Investigation of DC Characteristics Degradation in Silicon Nanosheet FET Due to Interface Traps

    Sohn, Dol
    ;
    Yoon, Sung-Su
    ;
    Park, Hyo-Jun
    ;
    Yun, Eui-Cheol
    ;
    Lee, Moon-Kwon
    ;
    Bang, Da-Eun
    ;
    Kim, Min-Woo
    Journal article
    2026, IEEE ACCESS, 14, p.122524-122535

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