Browsing by Author "Soin, N."
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Publication Energy distribution of positive charges in gate dielectric: probing technique and impacts of different defects
; Journal article2013, IEEE Transactions on Electron Devices, (60) 5, p.1745-1753Publication Energy distribution of positive charges in high-k dielectric
Journal article2014, Microelectronics Reliability, (54) 9_10, p.2329-2333Publication Negative bias temperature instability lifetime prediction: problems and solutions
; Proceedings paper2013, International Electron Devices Meeting - IEDM, 9/12/2013, p.413-416