Browsing by Author "Stampfl, F."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication CV Characterization of Si/SiGe heterostructures at Cryo Temperatures
; ; ; ; Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Terman method to study threshold voltage hysteresis of Si/SiGe heterostructures at cryogenic temperatures
Proceedings paper2026, IEEE International Reliability Physics Symposium (IRPS), 2026-03-22, p.1-6