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Browsing by Author "Szelag, B."

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    Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs

    Szelag, B.
    ;
    Kubicek, Stefan  
    ;
    De Meyer, Kristin  
    ;
    Balestra, F.
    Journal article
    1999, Electronics Letters, (35) 16, p.1385-1386

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