Browsing by Author "Tahoori, Mehdi"
Now showing 1 - 7 of 7
- Results per page
- Sort Options
Publication Analyzing the Electromigration Challenges of Computation in Resistive Memories
Proceedings paper2022, IEEE International Test Conference (ITC), SEP 25-30, 2022, p.534-538Publication Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes
Proceedings paper2023, Design, Automation and Test in Europe Conference and Exhibition (DATE), APR 17-19, 2023Publication Emerging Interconnect Exploration for SRAM Application Using Nonconventional H-Tree and Center-Pin Access
Proceedings paper2023, 24th International Symposium on Quality Electronic Design (ISQED), APR 05-07, 2023, p.209-209Publication Graphene-Based Interconnect Exploration for Large SRAM Caches for Ultrascaled Technology Nodes
Journal article2023-01-01, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 1, p.230-238Publication Technology/Memory Co-Design and Co-Optimization Using E-Tree Interconnect
Proceedings paper2023, 33rd Great Lakes Symposium on VLSI (GLSVLSI), JUN 05-07, 2023, p.159-162Publication The impact of process variation and stochastic aging in nanoscale VLSI
Proceedings paper2016, International Reliability Physics Symposium - IRPS, 2/04/2016, p.CR-1Publication Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM
Journal article2022, IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, (41) 12, p.5327-5332