Browsing by Author "Thayne, I."
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Publication Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures
Journal article2010, Microelectronics Reliability, (50) 3, p.360-364Publication Strained silicon SiGe HFETs for microwave applications
Oral presentation2003, 33rd European Microwave Conference (EuMC)