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Browsing by Author "Theuwis, A."

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    A study of the influence of typical wet chemical treatments on the germanium wafer surface

    Onsia, Bart  
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    Conard, Thierry  
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    De Gendt, Stefan  
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    Heyns, Marc  
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    Hoflijk, Ilse  
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    Mertens, Paul  
    Oral presentation
    2004, 7th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    A study of the influence of typical wet chemical treatments on the germanium wafer surface

    Onsia, Bart  
    ;
    Conard, Thierry  
    ;
    De Gendt, Stefan  
    ;
    Heyns, Marc  
    ;
    Hoflijk, Ilse  
    ;
    Mertens, Paul  
    Proceedings paper
    2005, Ultra Clean Processing of Silicon Surfaces VII: Proceedings of the 7th International Symposium, 20/09/2004, p.27-30
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    Deep level transient spectroacopy of transition metal impurities in germanium

    Clauws, P.
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    Van Gheluwe, J.
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    Lauwaert, J.
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    Simoen, Eddy  
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    Vanhellemont, J.
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    Meuris, Marc  
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    Theuwis, A.
    Journal article
    2007, Physica B: Condensed Matter, 401-402, p.188-191
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    Grown-in lattice defects and diffusion in czochralski-grown germanium

    Vanhellemont, J.
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    De Gryse, O.
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    Hens, S.
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    Vanmeerbeek, P.
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    Poelman, D.
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    Clauws, P.
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    Simoen, Eddy  
    Journal article
    2004, Defect and Diffusion Forum, 230-232, p.149-176
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    Lifetime and leakage current considerations in metal-doped germanium

    Simoen, Eddy  
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    Claeys, Cor
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    Sioncke, Sonja
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    Van Steenbergen, Jan  
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    Meuris, Marc  
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    Forment, S.
    Journal article
    2007, Journal of Materials Science: Materials in Electronics, (18) 7, p.799-804
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    Metal deposition on Ge surfaces

    Sioncke, Sonja
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    Onsia, Bart  
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    Struys, K.
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    Rip, Jens  
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    Vos, Rita  
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    Meuris, Marc  
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    Mertens, Paul  
    Proceedings paper
    2005, Cleaning Technology in Semiconductor Device Manufacturing IX, 16/10/2005, p.220-227
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    On the impact of metal impurities on the carrier lifetime in n-type germanium

    Gaubas, E.
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    Vanhellemont, J.
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    Simoen, Eddy  
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    Theuwis, A.
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    Clauws, P.
    Proceedings paper
    2007, Semiconductor Defect Engineering - Materials, Synthesis, Structures and Devices II, 9/04/2007, p.0994-F09-06
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    Particle deposition and removal from Ge wafers

    Sioncke, Sonja
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    Lux, Marcel  
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    Fyen, Wim
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    Meuris, Marc  
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    Theuwis, A.
    Proceedings paper
    2008, Ultra Clean Processing of Semiconductor Surfaces VIII - UCPSS, 18/09/2006, p.173-176
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    Study on the metal deposition behavior on Ge surfaces

    Sioncke, Sonja
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    Onsia, Bart  
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    Struys, K.
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    Meuris, Marc  
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    Mertens, Paul  
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    Theuwis, A.
    Meeting abstract
    2005, Meeting Abstracts 208th Meeting of The Electrochemical Society, 16/10/2005, p.780
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    Surface cleaning and preparation related aspects of the germanium surface chemistry

    Onsia, Bart  
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    Caymax, Matty  
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    Conard, Thierry  
    ;
    De Gendt, Stefan  
    ;
    Delabie, Annelies  
    ;
    Heyns, Marc  
    Oral presentation
    2004, Semiconductor Interface Secialists' Conference

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