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Browsing by Author "Thiam, A."

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    Patterning process and electrical yield optimization at the limits of single exposure EUV 0.33 NA: a pitch 26nm damascene process

    Blanco, Victor  
    ;
    Vandersmissen, Kevin  
    ;
    De Wachter, Bart  
    ;
    Nafus, K.
    ;
    Feurprier, Y.
    ;
    Thiam, A.
    ;
    Hsu, A.
    Proceedings paper
    2024, 2024 International Interconnect Technology Conference, 2024-06-24

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