Browsing by Author "Todi, Ravi"
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Publication Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Journal article2007, IEEE Electron Device Letters, (28) 4, p.288-291Publication On the origin of the 1/f noise in shallow germanium p+-n junctions
Journal article2007, Applied Physics Letters, (90) 4, p.43501Publication Processing factors impacting the leakage current and flicker noise of germanium p+-n junctions on silicon substrates
Journal article2008, Journal of the Electrochemical Society, (155) 3, p.H145-H150