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Browsing by Author "Tolle, J."

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    Phosphorus doped SiC source drain and SiGe channel for scaled bulk FinFETs

    Togo, Mitsuhiro
    ;
    Lee, Jae Woo
    ;
    Pantisano, Luigi
    ;
    Chiarella, Thomas  
    ;
    Ritzenthaler, Romain  
    Proceedings paper
    2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.18.2
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    SiGe band-to-band tunneling calibration based on p-i-n diodes: fabrication, measurement and simulation

    Kao, Frank  
    ;
    Verhulst, Anne  
    ;
    Rooyackers, Rita
    ;
    Hikavyy, Andriy  
    ;
    Simoen, Eddy  
    ;
    Arstila, Kai
    Proceedings paper
    2012, SiGe, Ge, and Related Compunds 5: Materials, Processing, and Devices, 7/10/2012, p.965-970

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