Browsing by Author "Trevisoli, R.D."
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Publication An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
Journal article2012, Microelectronics Reliability, (52) 3, p.519-524Publication Stress relaxation empirical model for biaxially strained triple-gate devices
Proceedings paper2011, Advanced Semiconductor-on-Insulator Technology and Related Physics, 1/05/2011, p.289-294