Browsing by Author "Tsai, Meng-Che"
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Publication Hole Generation Triggered Dynamic Drain Induced Barrier Lowering of RF GaN MIS-HEMTs
Journal article2026, IEEE ELECTRON DEVICE LETTERS, (47) 9, p.1740-1743Publication Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress
Journal article2025, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 10, p.5359-5365Publication Toward Understanding Stability of RF MIS-HEMTs under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30