Browsing by Author "Tuinhout, Hans"
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Publication A comparison of extraction techniques for threshold voltage mismatch
Proceedings paper2002, International Conference on Microelectronic Test Structures, 8/04/2002, p.235-240Publication CMOS device optimisation for mixed-signal technologies
;Stolk, Peter ;Tuinhout, Hans ;Duffy, Ray ;Augendre, Emmanuel ;Bellefroid, L. P.Bolt, M. J. B.Proceedings paper2001, IEDM Technical Digest, 2/12/2001, p.215-218