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Browsing by Author "Valentini, M.G."

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    Different nature of process-induced and stress-induced defects in thin SiO2 layers

    Cellere, G.
    ;
    Valentini, M.G.
    ;
    Pantisano, Luigi
    ;
    Cheung, K.P.
    ;
    Paccagnella, A.
    Journal article
    2003, IEEE Electron Device Letters, (24) 6, p.393-395

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