Browsing by Author "Vallauri, Raffaele"
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Publication Challenges probing next generation full array products with 60μm pitch and below
Proceedings paper2015-06, IEEE Semiconductor Wafer Test Workshop - SWTW, 7/06/2015Publication Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution
Proceedings paper2018-06, Semiconductor Wafer Test Workshop - SWTW, 3/06/2018Publication Testing & diagnosis of fine-pitch wafers and advanced packages
Oral presentation2018, SEMICON Taiwan