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Browsing by Author "Van Dal, Mark J. H."

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    Systematic TLM measurements of NiSi and PtSi specific contact resistance to n- and p- type Si in a broad doping range

    Stavitski, Natalie
    ;
    Van Dal, Mark J. H.
    ;
    Lauwers, Anne  
    ;
    Vrancken, Christa  
    ;
    Kovalgin, Alexey Y.
    Journal article
    2008, IEEE Electron Device Letters, (29) 4, p.378-381

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