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Browsing by Author "Van De Plas, Geert"

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    A novel in-situ resistance measurement to extract IMC resistivity and kinetic parameter for CoSn 3D stacks

    Hou, Lin  
    ;
    Derakhshandeh, Jaber  
    ;
    De Coster, Jeroen  
    ;
    Wang, Teng
    ;
    Cherman, Vladimir  
    ;
    Bex, Pieter  
    Proceedings paper
    2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.7.4

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