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Browsing by Author "Van Thielen, Bert"

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    A radiation-tolerant standard cell library for a commercial sub-micron technology

    Redant, Steven  
    ;
    De Mey, Bart
    ;
    Folens, Luc  
    ;
    Van Thielen, Bert
    ;
    Hollreiser, M.
    Proceedings paper
    2002, RADECS Workshop, 19/09/2002, p.61-64
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    HIT based flip-flops in the DARE library

    Redant, Steven  
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    Van Thielen, Bert
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    Dupont, Steven  
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    Baguena, L.
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    Liegeon, E.
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    Marec, R.
    Proceedings paper
    2004, 14th Biennial Single Event Effects Symposium - SEE, 27/04/2004
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    Radiation test results on first silicon in the Design Against Radiation Effects (DARE) library

    Redant, Steven  
    ;
    Marec, R.
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    Baguena, L.
    ;
    Liegeon, E.
    ;
    Soucarre, J.
    ;
    Van Thielen, Bert
    ;
    Beeckman, Gerd
    Journal article
    2005, IEEE Trans. Nuclear Science, (52) 5, p.1550-1554
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    The design against radiation effects (DARE) Library

    Redant, Steven  
    ;
    Marec, R.
    ;
    Baguena, L.
    ;
    Liegeon, E.
    ;
    Soucarre, J.
    ;
    Van Thielen, Bert
    ;
    Beeckman, Gerd
    Proceedings paper
    2004, Proceedings RADECS Workshop - Radiation Effects on Components and Systems, 22/09/2004, p.241-246

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