Browsing by Author "Vanhoenacker, D."
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Publication Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration
Proceedings paper2000, International Conference on Microelectronic Test Structures - ICMTS, 13/03/2000, p.241-245Publication Line impedance identification using a bidirectional search method
Oral presentation2000, IUAP P4/2 Study Day