Browsing by Author "Vankeirsbilck, Jens"
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Publication A new approach to selectively implement control flow error detection techniques
;Vankeirsbilck, Jens ;Van Waes, Jonas ;Hallez, HansBoydens, JeroenProceedings paper2019, Advances on P2P, Parallel, Grid, Cloud and Internet Computing. International Workshop on Distributed Embedded Systems, 7/11/2019, p.704-715Publication A Novel Model to Quantify the Impact of Transmission Parameters on the Coexistence Between Bluetooth Low Energy Pairs
;Pang, Bozheng ;Claeys, Tim ;Vankeirsbilck, Jens ;T'Jonck, Kristof ;Hallez, HansBoydens, JeroenJournal article2023, IEEE INTERNET OF THINGS JOURNAL, (10) 2, p.1733-1745Publication Automated regression testing of a GCC toolchain used on embedded CPU programs
;Vankeirsbilck, Jens ;Van Waes, Jonas ;Hallez, HansBoydens, JeroenProceedings paper2019, International Scientific Conference electronics - ET, 12/09/2019, p.1-4Publication Automatic implementation of control flow error detection techniques
;Vankeirsbilck, Jens ;Hallez, HansBoydens, JeroenProceedings paper2019, International Conference on Wireless Networks and Embedded Systems - ICWNES, 26/07/2019Publication CDFEDT – Comparison of Data Flow Error Detection Techniques in embedded systems: an empirical study
;Thati, Venu Babu ;Vankeirsbilck, Jens ;Penneman, Niels ;Pissoort, DavyBoydens, JeroenProceedings paper2018, ARES 2018 Proceedings of the 13th International Conference on Availability, Reliability and Security, 27/08/2018, p.Art. no 23Publication Control Flow Aware Software-Implemented Fault Injection for Embedded CPUs
;Vankeirsbilck, Jens ;Thati, Venu Babu ;Van Waes, Jonas ;Hallez, HansBoydens, JeroenProceedings paper2017, XXVI International Scientific Conference on Electronics - ET, 13/09/2017, p.1-4Publication Control flow errors in an industry 4.0 setup: a preliminary study
;Vankeirsbilck, Jens ;Van Waes, Jonas ;Hallez, Hans ;Pissoort, DavyBoydens, JeroenProceedings paper2019, International Conference on Systems, Man and Cybernetics, 6/10/2019Publication Data Error Detection and Recovery in Embedded Systems: a Literature Review
;Thati, Venu Babu ;Vankeirsbilck, Jens ;Boydens, JeroenPissoort, DavyJournal article2017, Advances in Science, Technology and Engineering Systems Journal, (2) 3, p.623-633Publication Effectiveness of data triplication in harsh electromagnetic environments
;Van Waes, Jonas ;Vankeirsbilck, Jens ;Lannoo, Jonas ;Pissoort, DavyBoydens, JeroenProceedings paper2018, EMC Europe 2018, IEEE International Symposium on Electromagnetic Compatibility, 27/08/2018Publication Effectiveness of hamming single error correction codes under harsh eectromagnetic disturbances
;Van Waes, Jonas ;Lannoo, Jonas ;Vankeirsbilck, Jens ;Degraeve, AndyPeuteman, JoanProceedings paper2018, EMC Europe 2018, IEEE International Symposium on Electromagnetic Compatibility, 26/08/2018Publication Electromagnetic Interference in the Internet of Things: an automotive insight
;Van Waes, Jonas ;Vankeirsbilck, Jens ;Pissoort, DavyBoydens, JeroenProceedings paper2017, XXVI International Scientific Conference on Electronics - ET, 13/09/2017, p.1-4Publication Functional Safety Standard's Techniques and Measures in Light of Electromagnetic Interference
;Van Waes, Jonas ;Vankeirsbilck, Jens ;Pissoort, DavyBoydens, JeroenProceedings paper2017, XXVI International Scientific Conference on Electronics - ET, 13/09/2017, p.1-4Publication Hybrid technique for soft error detection in dependable embedded software: a first experiment
;Venu babu, Venu Babu ;Vankeirsbilck, Jens ;Pissoort, DavyBoydens, JeroenProceedings paper2019, 2019 IEEE XXVIII International Scientific Conference Electronics - ET, 12/09/2019, p.1-4Publication Random additive control flow error detection
;Vankeirsbilck, Jens ;Penneman, Niels ;Hallez, HansBoydens, JeroenProceedings paper2018, International Conference on Computer Safety, Reliability, and Security - SAFECOMP 2018, 1/09/2018, p.220-234Publication Random additive signature monitoring for control flow error detection
;Vankeirsbilck, Jens ;Penneman, Niels ;Hallez, HansBoydens, JeroenJournal article2017, IEEE Transactions on Reliability, (66) 4, p.1178-1192