Browsing by Author "Vanmeerbeek, P."
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Publication A new lateral-IGBT structure with a wider safe operating area
Journal article2007, IEEE Electron Device Letters, (28) 5, p.416-418Publication An ultrafast and latch-up free lateral IGBT with hole diverter for junction-isolated technologies
Proceedings paper2007-06, 19th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 27/05/2007, p.21-24Publication Analysis of a narrow-base laterel IGBT with double buried layer for junction-isolated smart-power technologies
Journal article2008, IEEE Transactions on Electron Devices, (55) 1, p.435-445Publication Grown-in lattice defects and diffusion in czochralski-grown germanium
Journal article2004, Defect and Diffusion Forum, 230-232, p.149-176Publication Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Journal article2007, Microelectronics Reliability, (47) 9_11, p.1389-1393Publication Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
Proceedings paper2007, 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 11/07/2007, p.288-291