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Browsing by Author "Vannoost, Dries"

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    Complementary fault models for assessing the effectiveness of hamming codes

    Van Waes, Jonas
    ;
    Vankeirsblick, Jens
    ;
    Lannoo, Jonas
    ;
    Vannoost, Dries
    ;
    Pissoort, Davy
    Proceedings paper
    2019, XXVIII International Scientific Conference Electronics, 12/09/2019, p.1-4

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