Browsing by Author "Verbauwhede, I."

Now showing 1 - 7 of 7

A highly- portable true random number generator based on coherent sampling

Peetermans, A.
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Rozic, V.
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Verbauwhede, I.
Proceedings paper
2019, 2019 29th International Conference on Field Programmable Logic and Applications (FPL), 8/09/2019, p.218-224
An in-depth and black- box characterization of the effects of laser pulses on ATmega328P

Kumar, D.S.
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Beckers, A.
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Balasch, J.
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Gierlichs, B.
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Verbauwhede, I.
Proceedings paper
2019, Smart Card Research and Advanced Applications - CARDIS 2018, 12/11/2018, p.156-170
Characterization of EM faults on ATmega328p

Beckers, Arthur
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Balasch, J.
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Gierlichs, B.
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Verbauwhede, I.
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Osuka, S.
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Kinugawa, M.
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Fujimoto, D.
Proceedings paper
2019, 2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic, 3/06/2019, p.1-4
Decryption failure attacks on IND-CCA secure lattice-based schemes

D'Anvers, J.P.
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Guo, Q.
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Johansson, T.
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Nilsson, A.
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Vercauteren, F.
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Verbauwhede, I.
Proceedings paper
2019, PKC 2019: Public-Key Cryptography - PKC 2019. IACR International Workshop on Public Key Cryptography, 14/04/2019, p.565-598
Design and evaluation of a spark gap based EM-fault injection setup

Beckers, A.
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Kinugawa, M.
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Hayashi, Y.
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Balasch, J.
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Verbauwhede, I.
Proceedings paper
2020, 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 28/07/2020
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage

Osuka, S
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Fujimoto, D.
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Hayashi, Y.
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Homma, N.
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Beckers, A.
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Balasch, J.
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Gierlichs, B.
Journal article
2019, IEEE Transactions on Electromagnetic Compatibility, (1) 4, p.1122-1128
Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

Saraza Canflanca, Pablo
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Fodor, Ferenc
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Diaz Fortuny, Javier
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Gierlichs, B.
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Degraeve, Robin
Journal article
2024, IEEE ELECTRON DEVICE LETTERS, (45) 5, p.750-753