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    System identification approach applied to drift estimation

    Verbeyst, Farns
    ;
    Pintelon, Rik
    ;
    Rolain, Yves
    ;
    Schoukens, Johan
    ;
    Clement, Tracy S.
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007

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