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Browsing by Author "Verboven, P."

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    Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

    van Dael, M.
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    Verboven, P.
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    Zanella, A.
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    Sijbers, Jan  
    ;
    Nicolai, B.
    Journal article
    2019, Postharvest Biology and Technology, 148, p.218-227
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    Comparison of methods for online inspection of apple internal quality

    van Dael, M.
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    Verboven, P.
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    Van Hoorebeke, L.
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    Sijbers, Jan  
    ;
    Nicolai, B.
    Proceedings paper
    2017, 7th Conference on Industrial Computed Tomography - iCT, 2/07/2017, p.1-10
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    Electrochemical impedance spectroscopy in the presence of non-linear distortions and non-stationary behaviour Part I: Theory and validation

    Van Gheem, E.
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    Pintelon, R.
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    Vereecken, J.
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    Schoukens, J.
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    Hubin, A.
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    Verboven, P.
    ;
    Blajiev, O.
    Journal article
    2004, Electrochimica Acta, (49) 26, p.4753-4762
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    Instantaneous impedance measurements on aluminium using a Schroeder multisine excitation signal

    Van Gheem, E.
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    Vereecken, J.
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    Schoukens, J.
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    Pintelon, R.
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    Guillaume, P.
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    Verboven, P.
    ;
    Pauwels, L.
    Journal article
    2004, Electrochimica Acta, (49) 17_18, p.2919-2925
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    Multisensor X-ray inspection of internal defects in horticultural products

    van Dael, M.
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    Verboven, P.
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    Dhaene, J.
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    Van Hoorebeke, L.
    ;
    Sijbers, Jan  
    ;
    Nicolai, B.
    Journal article
    2017-06, Postharvest Biology and Technology, 128, p.33-43

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