Browsing by Author "Verhaege, K."

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ESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results

Russ, Christian
;
Gieser, H.
;
Verhaege, K.
Proceedings paper
1994, Proceedings of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF); October 4-7, 199, p.457-466
Influence of tester, test method and device type on CDM ESD testing

Verhaege, K.
;
Groeseneken, Guido
;
Maes, Herman
;
Egger, P.
;
Gieser, H.
Journal article
1995, IEEE Trans. Components Packaging and Manufacturing Technology. Part A, (18) 2, p.284-94
Investigation into socketed CDM (SDM) tester parasitics

Chaine, M.
;
Verhaege, K.
;
Avery, L.
;
Kelly, M.
;
Gieser, H.
;
Bock, Karlheinz
;
Henry, L. G.
;
Meuse, T.
Journal article
1999, Microelectronics and Reliability, (39) 11, p.1531-1540
The ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's

Verhaege, K.
;
Groeseneken, Guido
;
Colinge, Jean-Pierre
;
Maes, Herman
Journal article
1994, Microelectronics and Reliability, 35, p.555-556