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Browsing by Author "Versluys, J."

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    Analysis of oxygen thermal donor formation in n-type CZ silicon

    Rafi, Joan Marc
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    Simoen, Eddy  
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    Claeys, Cor
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    Ulyashin, A.G.
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    Job, R.
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    Fahrner, W.R.
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    Versluys, J.
    Proceedings paper
    2003, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 28/04/2003, p.96-105
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    Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon

    Simoen, Eddy  
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    Rafi, Joan Marc
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    Claeys, Cor
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    Neimash, V.
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    Kraitchinski, A.
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    Kras'ko, M.
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    Tischenko, V.
    Journal article
    2003, Japanese Journal of Applied Physics. Part 1: Regular Papers, (42) 3, p.7184-7188
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    DLTS study on deep levels formed in plasma hydrogenated and subsequently annealed silicon

    Huang, Y.L.
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    Simoen, Eddy  
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    Claeys, Cor
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    Job, R.
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    Ma, Y.
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    Düngen, W.
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    Fahrner, W.R.
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    Versluys, J.
    Proceedings paper
    2005, Gettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting, 25/09/2005, p.547-552
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    High-temperature electron-irradiation induced deep levels in n-type Cz silicon

    Simoen, Eddy  
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    Claeys, Cor
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    Neimash, V.
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    Kraitchinskii, A.
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    Kras'ko, M.
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    Tischenko, V.
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    Voitovych, V.
    Meeting abstract
    2003, International Scientific Meeting Belgian Physical Society, 27/05/2003, p.CM1-17
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    Hydrogen-induced thermal donor formation in n-type oxygenated high-resistivity FZ silicon

    Rafi, Joan Marc
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    Simoen, Eddy  
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    Claeys, Cor
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    Ulyashin, A.G.
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    Job, R.
    ;
    Fahrner, W.R.
    ;
    Versluys, J.
    Proceedings paper
    2002, Proceedings of the 5th Annual Workshop on Semiconductor Advances for Future Electronics - SAFE, 26/11/2002, p.91-98
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    Impact of direct plasma hydrogenation on thermal donor formation in N-type CZ silicon

    Rafi, Joan Marc
    ;
    Simoen, Eddy  
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    Claeys, Cor
    ;
    Huang, Y.L.
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    Ulyashin, A.G.
    ;
    Job, R.
    ;
    Versluys, J.
    Journal article
    2005, Journal of the Electrochemical Society, (152) 1, p.G16-G24
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    Investigations by capacitance methods of n-Si irradiated by electrons at 450°C

    Neimash, V.B.
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    Kras'Ko, M.M.
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    Kraitchinski, A.M.
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    Kolosyuk, A.G.
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    Voytovych, V.V.
    ;
    Simoen, Eddy  
    Journal article
    2004, Ukrainian Journal of Physics, (49) 8, p.779-784

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