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Browsing by Author "Verstraeten, Karel"

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    TXRF analysis of trace metals in thin silicon nitride films

    Vereecke, Guy  
    ;
    Arnauts, Sophia  
    ;
    Verstraeten, Karel
    ;
    Schaekers, Marc  
    ;
    Heyns, Marc  
    Meeting abstract
    2000, 8th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods, 25/09/2000

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