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Browsing by Author "Vexler, Mikhail I."

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    Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approach

    Sharma, Prateek
    ;
    Tyaginov, Stanislav  
    ;
    Rauch, Stewart E. III
    ;
    Franco, Jacopo  
    ;
    Makarov, Alexander
    Journal article
    2017, IEEE Electron Device Letters, (38) 2, p.160-163

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