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Browsing by Author "Voogt, F.C."

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    First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

    Merelle, Thomas
    ;
    Curatola, Gilberto
    ;
    Nackaerts, Axel
    ;
    Collaert, Nadine  
    ;
    Van Dal, Mark  
    Proceedings paper
    2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.241-244

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