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Browsing by Author "Vrielinck, Hemk"

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    Substitutional carbon loss in Si:C stressor layers probed by Deep-Level Transient Spectroscopy

    Simoen, Eddy  
    ;
    Dhayalan, Sathish Kumar
    ;
    Hikavyy, Andriy  
    ;
    Loo, Roger  
    ;
    Rosseel, Erik  
    Proceedings paper
    2016, 14th Symposium on High Purity and High Mobility Semiconductors, 2/10/2016, p.3-11

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