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Browsing by Author "Vystave, Tomas"

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    Applications of electron channeling pattern for the determination of wafer offcut and misorientation angles

    Han, Han  
    ;
    Strakos, Libor
    ;
    Porret, Clément  
    ;
    Depauw, Valerie  
    ;
    Vystave, Tomas
    ;
    Richard, Olivier  
    Journal article
    2025, MICRON, 199, p.103912

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