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Browsing by Author "Vystavel, Thomas"

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    Publication

    Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging

    Schulze, Andreas
    ;
    Han, Han  
    ;
    Strykos, Libor
    ;
    Vystavel, Thomas
    ;
    Porret, Clément  
    ;
    Loo, Roger  
    Meeting abstract
    2018, ECS AiMES 2018 Meeting, 30/09/2018, p.1069

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