Browsing by Author "Wang, Pei-Jung"
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Publication Analysis of Trap-Induced Dynamic Degradation in AlGaN/GaN Gated-Edge Termination Schottky Barrier Diodes Under Continuous Switching Operation
; ; ; ; ;Tso, Yu-TengWang, Pei-JungJournal article2026, IEEE TRANSACTIONS ON ELECTRON DEVICES, (73) 9, p.5452-5459