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Browsing by Author "Wei, C."

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    A very compact InP-based integrated optic Mach-Zehnder interferometer with a delay difference of 74ps

    Baets, Roel  
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    Wei, C.
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    Dobbelaere, G.
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    Haes, Jan
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    van Hoorebeke, O.
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    Tanghe, T.
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    De Dobbelaere, Peter
    Proceedings paper
    1995, ECIO `95 Proceedings.7th European Conference on Integrated Optics with Technical Exhibition. Regular and Invited Papers; April 3, p.323-326
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    An integrated optical add/drop multiplexer in InP based on elliptic couplers and Bragg grating reflector

    Wei, C.
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    Van Thourhout, Dries  
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    Moerman, Ingrid  
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    Goeman, Stefan
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    Vandeputte, Koen
    ;
    Baets, Roel  
    Proceedings paper
    1997, Digest of the IEEE/LEOS Summer Topical Meetings: Vertical-Cavity Lasers/Technologies for a Global Information Infrastructure ..., 13/08/1997, p.28-29
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    Elliptic beam converters on InP: design and experiment

    Wei, C.
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    Haes, Jan
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    Dobbelaere, G.
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    Demeester, Piet  
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    Baets, Roel  
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    Leijtens, X. J. M.
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    De Vreede, A. H.
    Proceedings paper
    1995, Proceedings of the 7th European Conference on Integrated Optics (ECIO'95); April 3-6, 1995; Delft, The Netherlands., p.193-196
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    Elliptic waveguide beam focusing and collimating elements in InP: analysis and experiment

    Wei, C.
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    Haes, Jan
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    Moerman, Ingrid  
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    Baets, Roel  
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    Smit, M. K.
    Journal article
    1995, Electronics Letters, (31) 25, p.2168-2169
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    Integrated optical elliptic couplers: modeling, design, and applications

    Wei, C.
    ;
    Groen, F.
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    Smit, M. K.
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    Moerman, Ingrid  
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    Van Daele, Peter  
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    Baets, Roel  
    Journal article
    1997, Journal of Lightwave Technology, (15) 5, p.906-912
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    New waveguide-fiber coupling method for fiber arrays based on integrated elliptic couplers

    Wei, C.
    ;
    Jarmolik, A.
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    Groen, F. H.
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    Vreeburg, C. G. M.
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    Vanwassenhove, Luc
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    Moerman, Ingrid  
    Proceedings paper
    1996, ECOC '96. 22nd European Conference on Optical Communication; 15-19 September 1996; Oslo, Norway., p.265-268
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    Realizing more accurate OPC models by utilizing SEM contours

    Wei, C.
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    Sejpal, R.
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    Deng, Y.
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    Kusnadi, I.
    ;
    Fenger, G.
    ;
    Oya, M.
    ;
    Okamoto, Y.
    ;
    Maruyama, K.
    ;
    Yamazaki, Y.
    Proceedings paper
    2020, Metrology, Inspection, and Process Control for Microlithography XXXIV, 23/03/2020, p.1132524
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    Very low loss compact waveguide beam collimators on InP

    Wei, C.
    ;
    Groen, F. H.
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    Vreeburg, C. G. M.
    ;
    Demeester, Piet  
    ;
    Baets, Roel  
    Journal article
    1996, Electronics Letters, (32) 16, p.1480-1481

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