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Browsing by Author "Wiesler, Ingo"

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    GHz-Scanning Acoustic Microscopy combined with TOFSIMS/AFM for wafer-level failure analysis of bonding interfaces

    De Wolf, Ingrid  
    ;
    Khaled, Ahmad  
    ;
    Franquet, Alexis  
    ;
    Spampinato, Valentina  
    ;
    Conard, Thierry  
    Proceedings paper
    2019, 45th International Symposium for Testing and Failure Analysis (ISTFA), 10/11/2019

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