Browsing by Author "Wojciechowski, D."
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Publication Evidence for source-side injection hot carrier effects on lateral DMOS transistors
;Aresu, Stefano; ; ; ;Moens, P.Manca, JeanJournal article2004, Microelectronics Reliability, (44) 9_11, p.1621-1624Publication Evidence for source-side injection hot carrier effects on lateral DMOS transistors
Proceedings paper2004, Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF, 4/10/2004, p.1621-1624