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Browsing by Author "Wondrak, W."

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    Failure mechanisms and qualification testing of passive components

    Post, H.A.
    ;
    Letullier, P.
    ;
    Briolat, T.
    ;
    Humke, R.
    ;
    Schuhmann, R.
    ;
    Saarinen, K.
    ;
    Werner, W.
    ;
    Ousten, Y.
    Journal article
    2005, Microelectronics Reliability, (45) 9_11, p.1626-1632

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