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Browsing by Author "Wong, C.S."

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    Development of B-spline x-ray diffraction imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips

    Wong, C.S.
    ;
    Ivankovic, Andrej
    ;
    Cowley, A.
    ;
    Bennett, N.S.
    ;
    Danilewsky, A.
    ;
    Gonzalez, Mario  
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.1517-1522

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