Browsing by Author "Wortelboer, R."
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Calibration of straight total reflection X-ray fluorescence spectrometry - results of a European round robin test
Journal article2001, Spectrochimica Acta Part B-Atomic Spectroscopy, (56) 11, p.2283-2292Publication Vapor phase decomposition - droplet collection evalutation of a wafer surface preparation system
Proceedings paper2000, Cleaning Technology in Semiconductor Device Manufacturing. Proceedings of the 6th International Symposium, 17/10/1999, p.593-600Publication Vapor phase decomposition - droplet collection: Evalutation of a wafer surface preparation system
Meeting abstract1999, Electrochemical Society Fall Meeting: 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 17/10/1999, p.1125