Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Wu, X."

Filter results by typing the first few letters
Now showing 1 - 12 of 12
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    A hybrid perturbative-stochastic Galerkin method for the variability analysis of nonuniform transmission lines

    Wu, X.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    ;
    Grassi, F.
    Journal article
    2020-06, IEEE Transactions on Electromagnetic Compatibility, (62) 3, p.746-754
  • Loading...
    Thumbnail Image
    Publication

    Circuit interpretation and perturbative analysis of differential-to-common mode conversion due to bend discontinuities

    Wu, X.
    ;
    Grassi, F.
    ;
    Pignari, S.A.
    ;
    Manfredi, Paolo
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2018, IEEE Electrical Design of Advanced Packaging and Systems Symposium - EDAPS, 14/12/2017, p.1-3
  • Loading...
    Thumbnail Image
    Publication

    Compensating mode conversion due to bend discontinuities through intentional trace asymmetry

    Wu, X.
    ;
    Grassi, F.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    ;
    Pignari, S.A.
    Journal article
    2020-04, IEEE Transactions on Electromagnetic Compatibility, (62) 2, p.617-621
  • Loading...
    Thumbnail Image
    Publication

    Effects of undesired asymmetries and nonuniformities in differential lines

    Grassi, F.
    ;
    Manfredi, Paolo
    ;
    Liu, X.
    ;
    Sun, J.
    ;
    Wu, X.
    ;
    Vande Ginste, Dries  
    ;
    Pignari, S.A.
    Journal article
    2018, IEEE Transactions on Electromagnetic Compatibility, (59) 5, p.1613-1624
  • Loading...
    Thumbnail Image
    Publication

    Efficiency of the perturbative stochastic galerkin method for multiple differential PCB lines

    Wu, X.
    ;
    Grassi, F.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2018, IEEE Electrical Design of Advanced Packaging and Systems Symposium - EDAPS, 16/12/2018, p.1-3
  • Loading...
    Thumbnail Image
    Publication

    Fast and accurate statistical estimation of common mode voltages and currents in weakly

    Wu, X.
    ;
    Grassi, F.
    ;
    Manfredi, Paolo
    ;
    Spadacini, G.
    ;
    Vande Ginste, Dries  
    ;
    Pignari, S.A.
    Proceedings paper
    2017, XXXIInd URSI General Assembly and Scientific Symposium - GASS, 19/08/2017, p.1-4
  • Loading...
    Thumbnail Image
    Publication

    Generation of common mode in non-uniform differential interconnections

    Wu, X.
    ;
    Grassi, F.
    ;
    Liu, X.
    ;
    Sun, J.
    ;
    Pignari, S.A.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2017-06, Asia-Pacific International Symposium on Electromagnetic Compatibility - APEMC, 20/06/2017, p.256-258
  • Loading...
    Thumbnail Image
    Publication

    Perturbative analysis of differential-to-common mode conversion in asymmetric nonuniform interconnects

    Wu, X.
    ;
    Grassi, F.
    ;
    Manfredi, Paolo
    ;
    Vande Ginste, Dries  
    Journal article
    2018-02, IEEE Transactions on Electromagnetic Compatibility, (60) 1, p.7-15
  • Loading...
    Thumbnail Image
    Publication

    Perturbative reformulation of the stochastic Galerkin method for statistical analysis of wiring structures with several random parameters

    Wu, X.
    ;
    Grassi, F.
    ;
    Pignari, S.A.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2018, IEEE Symposium on Electromagnetic Compatibility, Signal & Power Integrity - EMC, SI & PI, 30/07/2018, p.170-174
  • Loading...
    Thumbnail Image
    Publication

    Perturbative statistical assessment of PCB differential interconnects

    Wu, X.
    ;
    Frassi, F.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2018, IEEE 22nd Workshop on Signal and Power Integrity (SPI), 22/05/2018, p.1-4
  • Loading...
    Thumbnail Image
    Publication

    Perturbative statistical assessment of PCB differential interconnects

    Wu, X.
    ;
    Grassi, F.
    ;
    Manfredi, P.
    ;
    Vande Ginste, Dries  
    Proceedings paper
    2018, 2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI), 22/05/2018
  • Loading...
    Thumbnail Image
    Publication

    Threshold shift observed in resistive switching in metal-oxide-semiconductor transistors and the effect of forming gas anneal

    Liu, W.H.
    ;
    Pey, K.L.
    ;
    Wu, X.
    ;
    Raghavan, N.
    ;
    Padovani, A.
    ;
    Larcher, L.
    ;
    Vandelli, L.
    ;
    Bosman, M.
    Journal article
    2011, Applied Physics Letters, (99) 23, p.232909

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings