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Browsing by Author "Wuyts, Koen"

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    A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs

    Watté, J.
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    Wuyts, Koen
    ;
    Silverans, R. E.
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    Van Hove, Marleen
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    Van Rossum, Marc
    Journal article
    1994, Journal of Applied Physics, 75, p.2055-2060
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    Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures

    Wuyts, Koen
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    Watté, J.
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    Silverans, R. E.
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    Van Hove, Marleen
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    Borghs, Gustaaf  
    ;
    Palmstrøm, C. J.
    Journal article
    1994, Appl. Phys. Lett., 64, p.2406-2408
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    Correlation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs

    Lin, X. W.
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    Watté, J.
    ;
    Wuyts, Koen
    ;
    Liliental-Weber, Z.
    ;
    Washburn, J.
    Proceedings paper
    1994, Advanced Metallization for Devices and Circuits : Science, Technology and Manufacturability; April 4-8, 1994; San Francisco, Cal, p.295-300
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    Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors

    Abou-Khalil, M.
    ;
    Schreurs, Dominique  
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    Nauwelaers, Bart  
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    Van Rossum, Marc
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    Maciejko, R.
    Journal article
    1997, Journal of Applied Physics, (82) 12, p.6312-18
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    Property rights in R&D

    Wuyts, Koen
    Oral presentation
    1996, Vlerick School for Management: R&D Management and Innovative Performance; June 20, 1996;
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    Software licensing from the viewpoint of a R&D institute: a case study

    Wuyts, Koen
    Oral presentation
    1996, LES Topical Meeting; September 24, 1996; Liège, Belgium.
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    The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy

    Watté, J.
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    Silverans, R. E.
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    Münder, H.
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    Palmstrøm, C. J.
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    Florez, L. T.
    ;
    Van Hove, Marleen
    Proceedings paper
    1994, Advanced Metallization for Devices and Circuits - Science, Technology and Manufacturing III, 04/04/1994, p.331-337

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