Browsing by Author "Wuyts, Koen"
Now showing 1 - 7 of 7
- Results Per Page
- Sort Options
Publication A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
;Watté, J. ;Wuyts, Koen ;Silverans, R. E. ;Van Hove, MarleenVan Rossum, MarcJournal article1994, Journal of Applied Physics, 75, p.2055-2060Publication Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures
Journal article1994, Appl. Phys. Lett., 64, p.2406-2408Publication Correlation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs
;Lin, X. W. ;Watté, J. ;Wuyts, Koen ;Liliental-Weber, Z.Washburn, J.Proceedings paper1994, Advanced Metallization for Devices and Circuits : Science, Technology and Manufacturability; April 4-8, 1994; San Francisco, Cal, p.295-300Publication Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors
Journal article1997, Journal of Applied Physics, (82) 12, p.6312-18Publication Property rights in R&D
Wuyts, KoenOral presentation1996, Vlerick School for Management: R&D Management and Innovative Performance; June 20, 1996;Publication Software licensing from the viewpoint of a R&D institute: a case study
Wuyts, KoenOral presentation1996, LES Topical Meeting; September 24, 1996; Liège, Belgium.Publication The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy
;Watté, J. ;Silverans, R. E. ;Münder, H. ;Palmstrøm, C. J. ;Florez, L. T.Van Hove, MarleenProceedings paper1994, Advanced Metallization for Devices and Circuits - Science, Technology and Manufacturing III, 04/04/1994, p.331-337