Browsing by Author "Ye, T."
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Publication Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs
;Fang, Wen; ; ;Cho, Moon Ju; ; Luo, JunJournal article2016, IEEE Electron Device Letters, (37) 4, p.363-365Publication Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation
;Duan, N. ;Luo, J. ;Wang, G. ;Liu, J.; ;Mao, S. ;Radamson, H. ;Wang, X. ;Li, J. ;Wang, W.Zhao, C.Journal article2016, IEEE Transactions on Electron Devices, (63) 11, p.4546-4549