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Browsing by Author "Yeap, K.B."

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    Publication

    Testing the limits of TaN barrier scaling

    Witt, Christian  
    ;
    Yeap, K.B.
    ;
    Lesniewska, Alicja  
    ;
    Wan, Danny  
    ;
    Jourdan, Nicolas  
    ;
    Ciofi, Ivan  
    Meeting abstract
    2018, IEEE International Interconnect Technology Conference - IITC, 4/06/2018, p.54-56

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