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Browsing by Author "Yoshida, S."

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    The impact of energy barrier height on border traps in III-V gate stacks

    Yoshida, S.
    ;
    Taniguchi, S.
    ;
    Minari, Hideki
    ;
    Lin, Dennis  
    ;
    Ivanov, Tsvetan  
    ;
    Watanabe, H.
    Proceedings paper
    2015, Extended Abstracts of International Workshop on Dielectric Thin Films for Future Electron Devices - IWDTF, 2/11/2015, p.75-76

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