Browsing by Author "Yoshida, T."

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Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon

Takakura, K.
;
Ohyama, H.
;
Yoshida, T.
;
Murakawa, H.
;
Rafi, Joan Marc
;
Job, R.
;
Ulyashin, A.
Journal article
2003, Physica B, 340-342, p.1022-1025
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si

Takakura, K.
;
Ohyama, H.
;
Yoshida, T.
;
Murakawa, H.
;
Rafi, Joan Marc
;
Job, R.
;
Ulyashin, A.
Proceedings paper
2004, Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003, 21/09/2003, p.53-58
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si

Takakura, K.
;
Ohyama, H.
;
Yoshida, T.
;
Murakawa, H.
;
Rafi, Joan Marc
;
Job, R.
;
Ulyashin, A.
Oral presentation
2003, Gettering and Defect Engineering in Semiconductor Technology - GADEST
Electron irradiation effect on thermal donors in CZ-Si

Takakura, K.
;
Ohyama, H.
;
Murakawa, H.
;
Yoshida, T.
;
Rafi, Joan Marc
;
Job, R.
;
Ulyashin, A.
Journal article
2004, European Physical Journal - Applied Physics, 27, p.133-135
Electron irradiation effects on thermal donors in Cz-Si

Takakura, K.
;
Ohyama, Hidenori
;
Murakawa, H.
;
Yoshida, T.
;
Rafi, Joan Marc
;
Job, R.
;
Ulyashin, A.
Oral presentation
2003, 10th Int. Conf. on Defect Recognition, Imaging and Physics of Semiconductors - DRIP X