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Browsing by Author "Zhang, J. C."

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    Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction

    Meng, D.
    ;
    Zhang, J. F.
    ;
    Zhang, J. C.
    ;
    Zhang, W.
    ;
    Ji, Z.
    ;
    Benbakhti, B.
    ;
    Zheng, X. F.
    ;
    Hao, Y.
    ;
    Vigar, D.
    Proceedings paper
    2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-5.1-XT-5.7

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