Browsing by Author "Zhang, J. C."
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Publication Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
;Meng, D. ;Zhang, J. F. ;Zhang, J. C. ;Zhang, W. ;Ji, Z. ;Benbakhti, B. ;Zheng, X. F. ;Hao, Y.Vigar, D.Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-5.1-XT-5.7